Technical Scope and Capabilities

This service measures

• band-edge photoluminescence
• stimulated emission
• defect-related emission of semiconductor materials and devices.

Core Infrastructure / Tools / Equipment

The service uses

• PHAROS femtosecond KGW:Yb laser, 10 W, 10 kHz, 200 fs, 1030 nm
• Orpheus optical parametric amplifier, 210–2500 nm
• Andor Kymera 328i spectrometer
• Hamamatsu UV-VIS BT-CCD
• Andor Kymera 193i spectrometer
• Hamamatsu NIR CCD
• photoluminescence setup
• excitation range 210–2500 nm
• detection range 300–2500 nm
• sample temperature 10–800 K
• sample size from 1 × 1 mm to 100 × 100 mm
• maximum sample size of 25 × 25 mm for temperature measurements
• laser power and energy meters
• UV-VIS beam profiler
• ultrasonic bath for sample cleaning and preparation.

Service Delivery Terms and Times

The service is provided by responsible laboratory staff. Clients cannot perform measurements independently.