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Photonic integrated circuits
Prototyping
Luminescence and Surface Morphology Measurement Using Scanning Near-Field Optical Microscopy
Photonic Integrated Circuits
Technical Scope and Capabilities
This service provides spatially resolved luminescence measurement and surface morphology analysis using scanning near-field optical microscopy. It supports simultaneous high-spatial-resolution optical imaging and surface morphology information.
Core Infrastructure / Tools / Equipment
The service uses
- WITec 300S multifunctional microscopy system
- CW He-Cd laser at 442 nm
- laser diodes at 405, 552 and 662 nm
- spectrometer with CCD camera for recording in the 420–850 nm spectral range.
Technical Parameters
- optical resolution approximately 100 nm
- surface morphology resolution approximately 200 nm
- maximum scan area 80 × 80 micrometre squared
- typical scan area 10 × 10 micrometre squared.
Possible Restrictions
- One typical measurement takes approximately 60 minutes
- delivery time depends on number of samples and investigation scope
- clients cannot perform measurements independently
- measurements are carried out in transmission mode
- upper and lower surfaces of the sample must be polished
- the sample must be sufficiently thin so that self-absorption does not interfere with signal detection.