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Photonic integrated circuits
Prototyping
Spatially Resolved Luminescence Measurement and Analysis
Photonic Integrated Circuits
Technical Scope and Capabilities
This service provides spatially resolved luminescence measurement and analysis using a confocal microscope.
The service supports
- investigation of spatial distribution of luminescence
- optical sectioning into sample depth
- analysis of inhomogeneities in luminescent properties.
Core Infrastructure / Tools / Equipment
The service uses
- WITec 300S multifunctional microscopy system
- CW He-Cd laser at 442 nm
- laser diodes at 405, 552 and 662 nm
- spectrometers with CCD cameras for luminescence recording in 420–850 nm or 800–2200 nm ranges
- objectives of 50× NA 0.55, 60× NA 0.8 and 100× NA 0.9.
Technical Parameters
Spatial resolution:
- approximately 250 nm in the sample surface plane
- approximately 800 nm perpendicular to the surface.
Target Audience and Possible Clients
The service is relevant to organisations working with optical properties of materials, surfaces, micro- and nanostructures, semiconductor structures and optoelectronic devices.
Possible Restrictions
- One typical measurement takes approximately 30 minutes
- total delivery time depends on number of samples and investigation scope
- clients cannot perform measurements independently
- maximum scan area for one measurement is 80 × 80 micrometre squared.