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Photonic integrated circuits Prototyping

Quantum Yield Measurements

Photonic Integrated Circuits

Reference
4.4.11
Lead partner
VU

Technical Scope and Capabilities

This service determines emission efficiency by measuring the ratio of absorbed to emitted photons in luminescent semiconductor materials.

Core Infrastructure / Tools / Equipment

The service uses

  • PHAROS femtosecond KGW:Yb laser, 10 W, 10 kHz, 200 fs, 1030 nm
  • Orpheus optical parametric amplifier, 210–2500 nm
  • Gigahertz-Optik integrating sphere, 150 mm diameter, BaSO₄ coating
  • excitation range 350–1000 nm
  • detection range 350–1000 nm.

Service Delivery Terms and Times

The service is provided by responsible laboratory staff. Clients cannot perform measurements independently.

Possible Restrictions

Front and back surfaces must be polished to optical-quality standards.

Surface Morphology Measurement Using Atomic Force Microscopy