Technical Scope and Capabilities

This service provides time-resolved measurements of UV-VIS emission decay kinetics, including

• band-edge luminescence
• stimulated emission
• defect-related emission in semiconductor materials and devices.

Core Infrastructure / Tools / Equipment

The service uses

• PHAROS femtosecond KGW:Yb laser, 10 W, 10 kHz, 200 fs, 1030 nm
• Orpheus optical parametric amplifier, 210–2500 nm
• Andor Kymera 328i spectrometer
• Hamamatsu Streak camera C10910-05
• time-resolved luminescence setup
• excitation range 210–2500 nm
• detection range 300–1100 nm
• time resolution 4 ps for 0.1–12 ns temporal window
• time resolution 35 ps for 2 ns–1 ms temporal window
• sample temperature 10–800 K
• sample size from 1 × 1 mm to 100 × 100 mm
• maximum sample size of 25 × 25 mm for temperature measurements
• laser power and energy meters
• UV-VIS beam profiler
• ultrasonic bath for sample cleaning and preparation.

Service Delivery Terms and Times

The service is provided by responsible laboratory staff. Clients cannot perform measurements independently.