Back to service catalogue
Fotoniniai integriniai grandynai (PIC)
Prototyping
Emission Decay Kinetics Measurements
This service is delivered by VU.
Photonic Integrated Circuits
Technical Scope and Capabilities
This service provides time-resolved measurements of UV-VIS emission decay kinetics, including
- band-edge luminescence
- stimulated emission
- defect-related emission in semiconductor materials and devices.
Core Infrastructure / Tools / Equipment
The service uses
- PHAROS femtosecond KGW:Yb laser, 10 W, 10 kHz, 200 fs, 1030 nm
- Orpheus optical parametric amplifier, 210–2500 nm
- Andor Kymera 328i spectrometer
- Hamamatsu Streak camera C10910-05
- time-resolved luminescence setup
- excitation range 210–2500 nm
- detection range 300–1100 nm
- time resolution 4 ps for 0.1–12 ns temporal window
- time resolution 35 ps for 2 ns–1 ms temporal window
- sample temperature 10–800 K
- sample size from 1 × 1 mm to 100 × 100 mm
- maximum sample size of 25 × 25 mm for temperature measurements
- laser power and energy meters
- UV-VIS beam profiler
- ultrasonic bath for sample cleaning and preparation.
Service Delivery Terms and Times
The service is provided by responsible laboratory staff. Clients cannot perform measurements independently.