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Galios elektronika
Testing
Defect Spectroscopy by Deep Level Transient Spectroscopy
Power Electronics
Technical Scope and Capabilities
This service provides defect spectroscopy in semiconductor structures and devices using deep level transient spectroscopy.
The service supports
- recording of C-I-O-DLTS spectra
- spectroscopy of defects in semiconductor structures and devices
- carrier injection using pulsed lasers.
Core Infrastructure / Tools / Equipment
The service uses
- HERA-DLTS System FT 1030
- temperature range 10 K to 450 K
- pulsed lasers at 1062 nm, 531 nm and 354 nm
- advanced instruments for spectra analysis.
Service Delivery Terms and Times
Details regarding terms, limitations and related matters are discussed separately with interested parties.