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Chip design

Failure Analysis of Integrated Circuits

Design and Modelling

Reference
4.1.15
Lead partner
VILNIUS TECH

Technical Scope and Capabilities

This service determines root causes of non-functional or malfunctioning chips using electrical and RF testing methods.

Diagnostics cover:

  • signal analysis
  • parameter measurements
  • functional verification
  • parasitic effects
  • thermal conditions
  • material defects
  • process variations.

Expected Outputs

The service provides recommendations for design improvements, manufacturing parameter adjustments or test procedure optimisation.

System-Level Integration Consulting

CC
VILNIUS TECH
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